A comprehensive phase-spectrum approach to metrological characterization of hysteretic ADCs

@article{Monteiro2002ACP,
  title={A comprehensive phase-spectrum approach to metrological characterization of hysteretic ADCs},
  author={Conceigio Libano Monteiro and Pasquale Arpaia and Antonio Cruz Serra},
  journal={IEEE Trans. Instrumentation and Measurement},
  year={2002},
  volume={51},
  pages={756-763}
}
A phase-spectrum-based approach to the dynamic characterization of hysteretic analog-to-digital converters is proposed. Analytical relations between hysteresis of the dynamic transfer characteristic and out-of-phase components of the output Fourier spectrum are given. On this basis, an error model, a figure of merit, and a procedure for dynamic hysteresis testing are presented. Results of numerical characterization and experimental validation tests highlight the practical effectiveness of the… CONTINUE READING