A comprehensive analog single-event transient analysis methodology

@article{Savage2004ACA,
  title={A comprehensive analog single-event transient analysis methodology},
  author={M. W. Savage and J. L. Titus and T. L. Turflinger and R. Fabian R. Pease and Christian Poivey},
  journal={IEEE Transactions on Nuclear Science},
  year={2004},
  volume={51},
  pages={3546-3552}
}
A new method for analyzing analog single-event transient (ASET) data has been developed. The approach allows for quantitative error calculations, given device failure thresholds. The method is described and employed in the analysis of an OP-27 op-amp. 

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