A comprehensive analog single-event transient analysis methodology

@article{Savage2004ACA,
title={A comprehensive analog single-event transient analysis methodology},
author={M. W. Savage and J. L. Titus and T. L. Turflinger and R. Fabian R. Pease and Christian Poivey},
journal={IEEE Transactions on Nuclear Science},
year={2004},
volume={51},
pages={3546-3552}
}

Published 2004 in IEEE Transactions on Nuclear Science

A new method for analyzing analog single-event transient (ASET) data has been developed. The approach allows for quantitative error calculations, given device failure thresholds. The method is described and employed in the analysis of an OP-27 op-amp.Â