A cellular automata based high speed test hardware for word-organized memories

@article{Saha2012ACA,
  title={A cellular automata based high speed test hardware for word-organized memories},
  author={Mousumi Saha and B. K. Sikdar},
  journal={2012 International Conference on Devices, Circuits and Systems (ICDCS)},
  year={2012},
  pages={345-349}
}
Memories are the most defect sensitive parts in a machine computer. Conventionally, variations of March test are extensively used for functional test of SRAMs and DRAMs. In this work, we propose a CA (Cellular Automata) based scheme for efficient implementation of March test with the target to realize fault detection in high speed memories. The special class of CA referred to as the SACA is used for the purpose. The regular structure of CA enables low cost implementation of test logic for the… CONTINUE READING

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