A built-in parametric timing measurement unit

@article{Hsiao2004ABP,
  title={A built-in parametric timing measurement unit},
  author={Ming-Jun Hsiao and Jing-Reng Huang and Tsin-Yuan Chang},
  journal={IEEE Design & Test of Computers},
  year={2004},
  volume={21},
  pages={322-330}
}
On-chip timing-measurement units are needed because accessibility to internal nodes in SoCs is very limited, and performing time interval measurements using automatic test equipment is very difficult and expensive. We present a parametric timing measurement solution, which uses self-timed techniques and delivers high linearity and improved accuracy, at low risk of measurement error. Performing the time-to-digital conversion via built-in circuitry allows accurate measurement of short time… CONTINUE READING
Highly Cited
This paper has 30 citations. REVIEW CITATIONS

Citations

Publications citing this paper.
Showing 1-10 of 14 citations

References

Publications referenced by this paper.
Showing 1-6 of 6 references

Time Interval Measurements Using TimetoVoltage Conversion with Built - in DualSlope A / D Conversion

  • T. Rahkonen E. Räisänen-Ruosalainen
  • Proc . 19 th VLSI Test Symp . ( VTS 01 ) , IEEE…
  • 2001

On Using IEEE P 1500 SECT for Test PlugnPlay

  • Y. Zorian
  • Proc . Int ’ l Test Conf . ( ITC 00 ) , IEEE…
  • 2000

An Integrated TimetoDigital Converter with 30ps Single - Shot Precision

  • T. Rahkonen E. Räisänen-Ruosalainen
  • Proc . Int ’ l Symp . Circuits and Systems ( CAS…