A built-in parametric timing measurement unit

  title={A built-in parametric timing measurement unit},
  author={Ming-Jun Hsiao and Jing-Reng Huang and Tsin-Yuan Chang},
  journal={IEEE Design & Test of Computers},
On-chip timing-measurement units are needed because accessibility to internal nodes in SoCs is very limited, and performing time interval measurements using automatic test equipment is very difficult and expensive. We present a parametric timing measurement solution, which uses self-timed techniques and delivers high linearity and improved accuracy, at low risk of measurement error. Performing the time-to-digital conversion via built-in circuitry allows accurate measurement of short time… CONTINUE READING
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  • T. Rahkonen E. Räisänen-Ruosalainen
  • Proc . 19 th VLSI Test Symp . ( VTS 01 ) , IEEE…
  • 2001

On Using IEEE P 1500 SECT for Test PlugnPlay

  • Y. Zorian
  • Proc . Int ’ l Test Conf . ( ITC 00 ) , IEEE…
  • 2000

An Integrated TimetoDigital Converter with 30ps Single - Shot Precision

  • T. Rahkonen E. Räisänen-Ruosalainen
  • Proc . Int ’ l Symp . Circuits and Systems ( CAS…