A buckling-based metrology for measuring the elastic moduli of polymeric thin films.

@article{Stafford2004ABM,
  title={A buckling-based metrology for measuring the elastic moduli of polymeric thin films.},
  author={Christopher M. Stafford and Christopher Harrison and Kathryn L. Beers and Alamgir Karim and Eric J. Amis and Mark R Vanlandingham and Ho-Cheol Kim and Willi Volksen and Robert D. Miller and Eva E Simonyi},
  journal={Nature materials},
  year={2004},
  volume={3 8},
  pages={545-50}
}
As technology continues towards smaller, thinner and lighter devices, more stringent demands are placed on thin polymer films as diffusion barriers, dielectric coatings, electronic packaging and so on. Therefore, there is a growing need for testing platforms to rapidly determine the mechanical properties of thin polymer films and coatings. We introduce here… CONTINUE READING