A Wiener process model for accelerated degradation analysis considering measurement errors

@article{Li2016AWP,
  title={A Wiener process model for accelerated degradation analysis considering measurement errors},
  author={Junxing Li and Zhihua Wang and Xia Liu and Yongbo Zhang and Huimin Fu and Chengrui Liu},
  journal={Microelectronics Reliability},
  year={2016},
  volume={65},
  pages={8-15}
}