A Tutorial Introduction to Research on Analog and Mixed-Signal Circuit Testing

@inproceedings{Milor1998ATI,
  title={A Tutorial Introduction to Research on Analog and Mixed-Signal Circuit Testing},
  author={Linda S. Milor},
  year={1998}
}
Traditionally, work on analog testing has focused on diagnosing faults in board designs. Recently, with increasing levels of integration, not just diagnosing faults, but distinguishing between faulty and good circuits has become a problem. Analog blocks embedded in digital systems may not easily be separately testable. Consequently, many papers have been recently written proposing techniques to reduce the burden of testing analog and mixed-signal circuits. This survey attempts to outline some… CONTINUE READING
Highly Influential
This paper has highly influenced 18 other papers. REVIEW HIGHLY INFLUENTIAL CITATIONS
Highly Cited
This paper has 231 citations. REVIEW CITATIONS

Citations

Publications citing this paper.
Showing 1-10 of 160 extracted citations

Test Application for Analog/RF Circuits With Low Computational Burden

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems • 2012
View 7 Excerpts
Highly Influenced

Automated simulation of faults in analog circuits based on parallel paradigm

2017 IEEE East-West Design & Test Symposium (EWDTS) • 2017
View 3 Excerpts
Highly Influenced

KKCV-GA-Based Method for Optimal Analog Test Point Selection

IEEE Transactions on Instrumentation and Measurement • 2017
View 5 Excerpts
Highly Influenced

Every test makes a difference: Compressing analog tests to decrease production costs

2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC) • 2016
View 3 Excerpts
Highly Influenced

Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring

IEEE Transactions on Very Large Scale Integration (VLSI) Systems • 2013
View 5 Excerpts
Highly Influenced

231 Citations

0102030'99'03'08'13'18
Citations per Year
Semantic Scholar estimates that this publication has 231 citations based on the available data.

See our FAQ for additional information.

References

Publications referenced by this paper.
Showing 1-10 of 99 references

Structure and concepts for current-based analog scan

M. Soma
Proc. CICC, 1995, pp. 517–520. • 1995
View 5 Excerpts
Highly Influenced

Cutting the high cost of testing

IEEE Spectrum • 1991
View 16 Excerpts
Highly Influenced

Hybrid built-in self test (HBIST) for mixed analogue/digital integrated circuits

M. J. Ohletz
inProc. European Test Conf., 1991, pp. 307–316. • 1991
View 12 Excerpts
Highly Influenced

Built-in self-test (BIST) structure for analog circuit fault diagnosis,”IEEE

C. L. Wey
Trans. Instrum. Measur., • 1990
View 5 Excerpts
Highly Influenced

Test-point selection and testability measures via QR factorization of linear models

IEEE Transactions on Instrumentation and Measurement • 1987
View 4 Excerpts
Highly Influenced

Yield Simulation for Integrated Circuits.Norwell

D.M.H. Walker
MA: Kluwer, • 1987
View 4 Excerpts
Highly Influenced

Fault diagnosis of analog circuits

Proceedings of the IEEE • 1985
View 4 Excerpts
Highly Influenced

Optimal testing of VLSI analog circuits

IEEE Trans. on CAD of Integrated Circuits and Systems • 1997
View 7 Excerpts
Highly Influenced

Similar Papers

Loading similar papers…