A Testable Random Bit Generator based on a High Resolution Phase Noise Detection

Abstract

A novel, patent pending, technique to design random bit generators, suitable to be integrated in a cryptographic device, is presented. The proposed generator is based on a high resolution phase noise detection in free running ring oscillators and it belongs to the class of stateless generators introduced by the authors in a previous work. Therefore, the… (More)
DOI: 10.1109/DDECS.2007.4295249

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