A Test Methodology for High Performance MCMs

  title={A Test Methodology for High Performance MCMs},
  author={Thomas M. Storey and Bruce McWilliam},
  journal={J. Electronic Testing},
Satellite and avionics applications represent an ideal application for the tremendous performance, cost, space, and reliability benefits of MCMs. These advantages are only realized, however, if accompanied by an efficient test strategy which verifies defect-free fabrication. This paper describes a methodology developed to test high performance VLSI CMOS ICs… CONTINUE READING