A Systematic Method for Modifying March Tests for Bit-Oriented Memories into Tests for Word-Oriented Memories


Most memory test algorithms are optimized for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented, i.e., read and write operations affect only a single bit in the memory. Traditionally, word-oriented memories have been tested by repeated application of a test for bit-oriented memories… (More)
DOI: 10.1109/TC.2003.1234529


19 Figures and Tables