A Study of Outlier Analysis Techniques for Delay Testing

  title={A Study of Outlier Analysis Techniques for Delay Testing},
  author={Sean H. Wu and Dragoljub Gagi Drmanac and Li-C. Wang},
  journal={2008 IEEE International Test Conference},
This work provides a survey study of several outlier analysis techniques and compares their effectiveness in the context of delay testing. Three different approaches are studied, an Euclidean-distance based algorithm, random forest, and one-class support vector machine (SVM), from which more advanced methods are derived and analyzed. We conclude that one-class SVM using a polynomial kernel is most effective for detecting delay defects, while keeping overkills minimized. The best models were… CONTINUE READING
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