A Study of Implication Based Pseudo Functional Testing

@article{Syal2006ASO,
  title={A Study of Implication Based Pseudo Functional Testing},
  author={Manan Syal and Kameshwar Chandrasekar and Vishnu C. Vimjam and Michael S. Hsiao and Yi-Shing Chang and Sreejit Chakravarty},
  journal={2006 IEEE International Test Conference},
  year={2006},
  pages={1-10}
}
This paper presents a study of the implication based functional constraint extraction techniques to generate pseudo functional scan tests. Novel algorithms to extract pair-wise and multi-node constraints as Boolean expressions on arbitrary gates in the design are presented. Its impact on reducing the overkill in testing was analyzed, and report the trade-offs in coverage and scan-loads for a number of fault models. In the case of path-delay fault model, it was shown that the longest paths… CONTINUE READING
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Pseudo- Functional Testing

  • Lin Yung-Chieh, Lu Feng, K-T. Cheng
  • IEEE Transactions on Computer-Aided Design of…
  • 2005
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