Gámiz-Pérez, ‘Conditions on the arrival process to obtain HNBUE survival using a shock model
- M.L.R. Pérez-Ocón
A device subject to shocks occurring randomly according to a general counting process and failing when the cumulative damage exceeds a fixed threshold is considered. Sufficient conditions for the lifetime of this device belonging to the HNBUE class are given and as a consequence a procedure to obtain an HNBUE sample is performed. A computational program is implemented to obtain an HNBUE sample. Moreover, another computational program has been implemented to check whether these values belong to a smaller class than HNBUE by means of known graphic procedures, namely Lorenz and TTT curves. ( 1998 John Wiley & Sons, Ltd.