A Simulation Platform for the Study of Soft Errors on Signal Processing Circuits through Software Fault Injection

@article{Ruano2007ASP,
  title={A Simulation Platform for the Study of Soft Errors on Signal Processing Circuits through Software Fault Injection},
  author={O.. Ruano and Juan Antonio Maestro and P.. Reyes and Pedro Reviriego},
  journal={2007 IEEE International Symposium on Industrial Electronics},
  year={2007},
  pages={3316-3321}
}
In this paper, we present a simulation platform tailored for signal processing circuits that injects bit flips in order to model soft errors. The platform is based on the ESA Data Systems Division's SEE simulation tool upgraded with new functionalities. In order to show the effectiveness of the platform, a digital filter has been tested. 

From This Paper

Figures, tables, and topics from this paper.

Citations

Publications citing this paper.
SHOWING 1-10 OF 11 CITATIONS

References

Publications referenced by this paper.
SHOWING 1-10 OF 13 REFERENCES

Fleetwood, "Radiation effects and soft errors in integrated circuits and electronic devices

  • D.M.R.D. Schrimpf
  • World Scientific Publishing,
  • 2004
1 Excerpt

Single Even Upset Simulation Tool Functional Description

  • D. Gonzalez-Gutierrez
  • ESA Report TEC-EDM/DCC-SST2,
  • 2004
1 Excerpt

An Overview of the Space Radiation Environment

  • J. E. Mazur
  • The Aerospace Corporation Magazine of Advances in…
  • 2003
1 Excerpt

Lacoe. "Designing Integrated Circuits to Withstand Space

  • R.C.D.C. Mayer
  • The Aerospace Corporation Magazine of Advances in…
  • 2003
1 Excerpt

Massengill, "Basic Mechanisms and Modeling of Single-Event Upset in Digital Microelectronics

  • P. E. Dodd, LL
  • IEEE Transactions on Nuclear Science
  • 2003
1 Excerpt

Similar Papers

Loading similar papers…