A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios

@inproceedings{Rondey2002ASY,
  title={A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios},
  author={Emmanuel Rondey and Yann Tellier and Simone Borri},
  booktitle={MTDT},
  year={2002}
}
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