A Serial-Scan Test-Vector-Compression Methodology

@inproceedings{Su1993AST,
  title={A Serial-Scan Test-Vector-Compression Methodology},
  author={Chauchin Su and Kychin Hwang},
  booktitle={ITC},
  year={1993}
}
This paper presents a serial scan test vector compression methodology for the test time reduction in a scanbased test environment. The reduction is achieved by the overlapping of two consecutive vectors. Hence, the order of test vectors determines the amount of reduction in time. Here, two test vector ordering algorithm, depth first greedy and coalesced simple orders algorithms, have been derived, implemented, and tested. Experimental results obtained are very close to estimations by… CONTINUE READING
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Shaprio, Algorithms from P to NP, Benjamin/Cummings Publishing Company, Inc

  • B.M.E. Moret, H.D
  • Redwood City CA, U.S.A.,
  • 1991

Test Generation and Dynamic Compaction of Tests

  • T. W. Williams

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