A Self-Test of Dynamically Reconfigurable Processors with Test Frames

Abstract

This paper proposes a self-test method of coarse grain dynamically reconfigurable processors (DRPs) without hardware overhead. In the method, processor elements (PEs) compose a test frame, which consists of test pattern generators (TPGs), processor elements under test (PEUTs) and response analyzers (RAs), while testing themselves one another by changing… (More)
DOI: 10.1093/ietisy/e91-d.3.756

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Cite this paper

@article{Inoue2008ASO, title={A Self-Test of Dynamically Reconfigurable Processors with Test Frames}, author={Tomoo Inoue and Takashi Fujii and Hideyuki Ichihara}, journal={IEICE Transactions}, year={2008}, volume={91-D}, pages={756-762} }