A Robust Algorithm to Identify the Test Stimulus in Histogram-Based A/D Converter Testing

Abstract

Traditional testing of analog-to-digital converters (ADCs) with automatic test equipment is time-consuming and expensive, and a built-in self-test (BIST) can be one solution to this problem. Most of the proposed BIST routines require a well-known test stimulus which is much more linear than the device under test. A stimulus error identification and removal… (More)
DOI: 10.1109/TIM.2007.908133

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Cite this paper

@article{Korhonen2007ARA, title={A Robust Algorithm to Identify the Test Stimulus in Histogram-Based A/D Converter Testing}, author={Esa Korhonen and Juha H{\"a}kkinen and Juha Kostamovaara}, journal={IEEE Transactions on Instrumentation and Measurement}, year={2007}, volume={56}, pages={2369-2374} }