A Reliability Testing Environment for Off-the-Shelf Memory Subsystems

@article{Hwang2000ART,
  title={A Reliability Testing Environment for Off-the-Shelf Memory Subsystems},
  author={Seung H. Hwang and Gwan S. Choi},
  journal={IEEE Design & Test of Computers},
  year={2000},
  volume={17},
  pages={116-124}
}