A Reconfigurable Scan Architecture With Weighted Scan-Enable Signals for Deterministic BIST

Abstract

We present a new scan-based built-in self-test (BIST) technique, which is based on weighted scan-enable signals and a reconfigurable scan-forest architecture. A testability measure is proposed to guide test pattern generation and produce patterns with few care bits. This approach can effectively reduce the amount of test data that needs to be stored on-chip… (More)
DOI: 10.1109/TCAD.2008.923260

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@article{Xiang2008ARS, title={A Reconfigurable Scan Architecture With Weighted Scan-Enable Signals for Deterministic BIST}, author={Dong Xiang and Yang Zhao and Krishnendu Chakrabarty and Hideo Fujiwara}, journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems}, year={2008}, volume={27}, pages={999-1012} }