A Probabilistic Testability Measure for Delay Faults

Abstract

This paper firstly studies gate delay fault dominance relationships for the nortrobust and robust testings and presents fault collapsing procedures. A testability measure, based on a probability model, for the delay faults both for the nonrobust and the robust testings are proposed for combinational circuits and for sequential circuits. A program has been… (More)
DOI: 10.1145/127601.127709

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