A Probabilistic Method to Detect Anomalies in Embedded Systems

Abstract

Current-day embedded systems are very vulnerable to faults and defects. Anomaly detection is often the primary means of providing early indication of faults and defects. This paper presents a probabilistic method, which employs the probability of data events to evaluate the behavior of system. In order to measure the probability of events in the system… (More)
DOI: 10.1109/DFT.2010.25

6 Figures and Tables

Topics

  • Presentations referencing similar topics