A Probabilistic LDPC-Coded Fault Compensation Technique for Reliable Nanoscale Computing

@article{Winstead2009APL,
  title={A Probabilistic LDPC-Coded Fault Compensation Technique for Reliable Nanoscale Computing},
  author={Chris Winstead and Sheryl L. Howard},
  journal={IEEE Transactions on Circuits and Systems II: Express Briefs},
  year={2009},
  volume={56},
  pages={484-488}
}
A method is proposed for computing with unreliable nanoscale devices that have a high rate of transient errors. Errors are corrected using a probabilistic circuit in which device noise is leveraged as a computational asset. Example designs that achieve a low output bit error probability are presented. The effect of permanent defects is also evaluated, and transient device noise is found to be beneficial for correcting hard defects for defect rates of as high as 0.1% and transient fault rates… CONTINUE READING
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