A Novel High-Resolution Alignment Technique for XFEL Using Undulator X-ray Beams

Abstract

We propose a novel alignment technique utilizing the x-ray beam of an undulator in conjunction with pinholes and position-sensitive detectors for positioning components of the accelerator, undulator, and beamline in an x-ray free-electron laser. Two retractable pinholes at each end of the undulator define a stable and reproducible x-ray beam axis (XBA… (More)

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