A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test Itself

Abstract

A new built-in-self-test scheme, referred to as Test Vectors Applied by Circuit-under-Test (TVAC), is proposed in this paper. As the point of view of the paper, Circuit-under-Test (CUT) is no longer only regarded as a test object, but also a kind of available resources. By feedback connecting some of the CUTpsilas interior nodes to the input terminals, the… (More)
DOI: 10.1109/ATS.2008.25

Topics

3 Figures and Tables

Slides referencing similar topics