A Non-Scan Approach to DFT for Controllers Achieving 100% Fault Efficiency

@article{Ohtake2000ANA,
  title={A Non-Scan Approach to DFT for Controllers Achieving 100% Fault Efficiency},
  author={Satoshi Ohtake and Toshimitsu Masuzawa and Hideo Fujiwara},
  journal={J. Electronic Testing},
  year={2000},
  volume={16},
  pages={553-566}
}
This paper presents a non-scan design-for-testability method for controllers that are synthesized from FSMs (Finite State Machines). The proposed method can achieve complete fault efficiency: test patterns for a combinational circuit of a controller are applied to the controller using state transitions of the FSM. In the proposed method, at-speed test… CONTINUE READING