A Non-Intrusive and Accurate Inspection Method for Segment Delay Variabilities

@article{Chen2009ANA,
  title={A Non-Intrusive and Accurate Inspection Method for Segment Delay Variabilities},
  author={Ying-Yen Chen and Jing-Jia Liou},
  journal={2009 Asian Test Symposium},
  year={2009},
  pages={343-348}
}
Diagnosis for delay defects becomes more significant as the CMOS process advances to nanometer regime. The most challenging problems of delay fault diagnosis in nanometer process come from the process variation, which results in small delay variations. Small delay variations are difficult to be diagnosed by using existing methods based on a specific fault model. This paper presents a new estimation method for gate or interconnect delays based on the maximum likelihood estimation. The proposed… CONTINUE READING

From This Paper

Figures, tables, and topics from this paper.

Explore Further: Topics Discussed in This Paper

Citations

Publications citing this paper.
SHOWING 1-10 OF 13 CITATIONS

References

Publications referenced by this paper.
SHOWING 1-10 OF 22 REFERENCES

Similar Papers

Loading similar papers…