A Noise-Temperature Measurement System Using a Cryogenic Attenuator

@inproceedings{Fernndez1998ANM,
  title={A Noise-Temperature Measurement System Using a Cryogenic Attenuator},
  author={Jos{\'e} Enrique Fern{\'a}ndez},
  year={1998}
}
Accurate and rapid noise-temperature measurements are critical to the modeling and development of high electron mobility transistor (HEMT) cryogenically cooled amplifiers. Four different techniques have been used in the laboratory to make noise-temperature measurements of cryogenically cooled amplifiers, and each of these is described below. Following this, the cryogenic pad method, the method most often used by the Cryogenics–Electronics Front-End Equipment Group at JPL, is described. Although… CONTINUE READING
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