A New Reseeding Technique for LFSR-Based Test Pattern Generation

  title={A New Reseeding Technique for LFSR-Based Test Pattern Generation},
  author={Emmanouil Kalligeros and Xrysovalantis Kavousianos and Dimitris Bakalis and Dimitris Nikolos},
In this paper we present a new reseeding technique for LFSR-based test pattern generation suitable for circuits with random-pattern resistant faults. Our technique eliminates the need of a ROM for storing the seeds since the LFSR jumps from a state to the required state (seed) by inverting the logic value of some of the bits of its next state. An eflcient algorithm for selecting reseeding points is also presented, which targets complete fault coverage and minimization of the cardinality of the… CONTINUE READING
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