A New Microscopic Principle

@article{Gabor1948ANM,
  title={A New Microscopic Principle},
  author={Dennis Gabor},
  journal={Nature},
  year={1948},
  volume={161},
  pages={777-778}
}
  • D. Gabor
  • Published 1 May 1948
  • Physics
  • Nature
IT is known that the spherical aberration of electron lenses sets a limit to the resolving power of electron microscopes at about 5 A. Suggestions for the correction of objectives have been made ; but these are difficult in themselves, and the prospects of improvement are further aggravated by the fact that the resolution limit is proportional to the fourth root of the spherical aberration. Tnus an improvement of the resolution by one decimal wotild require a correction of the objective to four… 
An Order of Magnitude Improvement in STEM Resolution: Wavelength High-Energy Electron Localization
There have been many attempts to improve the resolution of electron microscopes. Transmission electron microscopes are normally limited in resolution by a balance between the diffraction limit (which
Spherical aberration measurement of a microscope objective by use of calibrated spherical particles.
TLDR
The purpose of this paper is to characterize the spherical aberration of a microscope objective lens by using diffraction light from nanosphere particles to measure optical aberrations with a good accuracy.
Prospects For Extending The Resolution Limit Of The Electron Microscope
TLDR
Current efforts are reviewed, and it is evident that the combined use of higher voltages and improved coherence is the direction that is presently leading to the greatest degree of progress.
The Electron Ronchigram
TLDR
This chapter will review the formation of the electron Ronchigram with a particular emphasis on the effects and measurement of aberrations.
Resolution beyond the 'information limit' in transmission electron microscopy
THE conventional resolution of transmission electron microscopes is orders of magnitude larger than the wavelength of the electrons used. Aberrations of the objective lens corrupt spatial information
Off-axis electron holography in an aberration-corrected transmission electron microscope
  • H. Lichte, D. Geiger, M. Linck
  • Physics
    Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences
  • 2009
TLDR
The signals of atomically fine structures are better defined for quantitative evaluation as, using the hardware corrector, the point-spread function shrinks considerably, the current density increases and the signal-to-noise ratio improves correspondingly.
Aberration Correction and Electron Holography
TLDR
Electron holography has been shown to allow a posteriori aberration correction, and an aberration corrector in the transmission electron microscope does not seem to be needed to achieve atomic lateral resolution, which is necessary to reach a signal resolution sufficient for detecting single light atoms and very small interatomic fields.
...
...