A Methodology for Automatic Insertion of Selective TMR in Digital Circuits Affected by SEUs

@article{Ruano2009AMF,
  title={A Methodology for Automatic Insertion of Selective TMR in Digital Circuits Affected by SEUs},
  author={O.. Ruano and J. A. Maestro and Pedro Reviriego},
  journal={IEEE Transactions on Nuclear Science},
  year={2009},
  volume={56},
  pages={2091-2102}
}
In this paper, a methodology to perform automatic selective TMR insertion on digital circuits is presented, having as a constraint the required reliability level. Such reliability is guaranteed while reducing the area compared to TMR. In addition, a performance enhancement is proposed in order to guarantee a computation time feasible for this automatic selective TMR insertion methodology. It focuses on the choice of a starting point close enough to an optimal solution. The method consists in… CONTINUE READING
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Data & Computer Communications

  • W. Stallings
  • Upper Saddle River, NJ: Pearson Prentice-Hall,
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