A Memory Debug Methodology Using BIST

@inproceedings{ExpresswayAMD,
  title={A Memory Debug Methodology Using BIST},
  author={S. Mopac Expressway}
}
  • S. Mopac Expressway
Built-in self test (BIST) is commonly used as a technique to test embedded arrays such as RAMs and ROMs. The primary use of BIST is for manufacturing or production testing but additional features can be added for diagnostics and debug. Conventional memory BIST implementations provide Pass/Fail information, which is usually sufficient for manufacturing test. This paper describes a novel feature of BIST using “Resume Mode” to start and stop BIST to capture memory failure information so it can be… CONTINUE READING

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Architecture of pipelined MBISTs and its configuration in complex SoC

2013 IEEE Symposium on Industrial Electronics & Applications • 2013
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