A Low-Cost High-Speed Pulse Response Based Built-In Self Test For Analog Integrated Circuits

Abstract

This paper presents a pulse response-based builtin self test technique and implementation for the testing of analog integrated circuits in mixed-signal systems. This BIST technique employs two narrow width pulses as input stimuli, and monitors two voltage samples on pulse response waveform for fault detection through allowable tolerances. The BIST system… (More)

Topics

6 Figures and Tables

Slides referencing similar topics