A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior

@article{Desineni2006ALD,
  title={A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior},
  author={Rao Desineni and Osei Poku and R. D. Blanton},
  journal={2006 IEEE International Test Conference},
  year={2006},
  pages={1-10}
}
DIAGNOSIX is a comprehensive fault diagnosis methodology for characterizing failures in digital ICs. Using limited layout information, DIAGNOSIX automatically extracts a fault model for a failing IC by analyzing the behavior of the physical neighborhood surrounding suspect lines. Results from several simulated and over 800 failing ICs reveal a significant improvement in localization. More importantly, the output of DIAGNOSIX is an accurate model of the logic-level defect behavior that provides… CONTINUE READING
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