A Leakage-aware Low Power Technology Mapping Algorithm Considering the Hot-Carrier Effect

@article{Kang2005ALL,
  title={A Leakage-aware Low Power Technology Mapping Algorithm Considering the Hot-Carrier Effect},
  author={Chang Woo Kang and Massoud Pedram},
  journal={J. Low Power Electronics},
  year={2005},
  volume={1},
  pages={133-144}
}
1 A preliminary version of this work has appeared in Proceedings of ASP-DAC 2003. ABSTRACT Leakage power and hot-carrier effects are emerging as key concerns in deep sub-micron CMOS technologies with respect to their effects on the total power dissipation and reliability of VLSI circuits. Leakage power dissipation is rapidly becoming a substantial contributor to the total power dissipation as threshold voltage becomes small. Similarly, the hot-carrier effect is one of the most significant… CONTINUE READING

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