A Knowledge Based System for Selecting a Test Methodology for a PLA

Abstract

Testability is a very important aspect of VLSI circuits. Numerous design for testability (DFT) methods exist. Often designers face the complex problem of selecting the best DFT techniques for a particular chip under a set of design constraints and goals. In order to aid in designing testable circuits, a prototype knowledge based system has been developed… (More)
DOI: 10.1145/317825.317868

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