A Hybrid Algorithm for Test Point Selection for Scan-Based BIST

@inproceedings{Tsai1997AHA,
  title={A Hybrid Algorithm for Test Point Selection for Scan-Based BIST},
  author={Huan-Chih Tsai and Kwang-Ting Cheng and Chih-Jen Lin and Sudipta Bhawmik},
  booktitle={DAC},
  year={1997}
}
We propose a new algorithm for test point selection forscan-based BIST.The new algorithm combines the advantagesof both explicit-testability-calculation and gradienttechniques.The test point selection is guided by acost function which is partially based on explicit testabilityrecalculation and partially on gradients.With anevent-driven mechanism, it can quickly identify a set ofnodes whose testability need to be recalculated due toa test point, and then use gradients to estimate the impactof… CONTINUE READING
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Schalz, \Test Point Insertion for Scan-Based BIST,

  • B. Seiss, P. Trouborst
  • Proc. of European Test Conf.,
  • 1991
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