A High-Speed Low-Noise CMOS Image Sensor With 13-b Column-Parallel Single-Ended Cyclic ADCs

@article{Park2009AHL,
  title={A High-Speed Low-Noise CMOS Image Sensor With 13-b Column-Parallel Single-Ended Cyclic ADCs},
  author={Jong-Ho Park and Satoshi Aoyama and Tetsushi Watanabe and Keigo Isobe and Shoji Kawahito},
  journal={IEEE Transactions on Electron Devices},
  year={2009},
  volume={56},
  pages={2414-2422}
}
A high-performance CMOS image sensor (CIS) with 13-b column-parallel single-ended cyclic ADCs is presented. The simplified single-ended circuits for the cyclic ADC are squeezed into a 5.6-mum-pitch single-side column. The proposed internal reference generation and return-to-zero digital signal feedback techniques enhance the ADC to have low read noise, a high resolution of 13 b, and a resulting dynamic range of 71 dB. An ultralow vertical fixed pattern noise of 0.1 erms - is attained by a… CONTINUE READING
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