A HEMT-Based Cryogenic Charge Amplifier with sub-100 eVee Ionization Resolution for Massive Semiconductor Dark Matter Detectors

@article{Phipps2019AHC,
  title={A HEMT-Based Cryogenic Charge Amplifier with sub-100 eVee Ionization Resolution for Massive Semiconductor Dark Matter Detectors},
  author={A. Phipps and A. Juillard and B. Sadoulet and B. Serfass and Y. Jin},
  journal={Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment},
  year={2019},
  volume={940},
  pages={181-184}
}
  • A. Phipps, A. Juillard, +2 authors Y. Jin
  • Published 2019
  • Physics
  • Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment
Abstract We present the measured baseline ionization resolution of a HEMT-based cryogenic charge amplifier coupled to a CDMS-II detector. The amplifier has been developed to allow massive semiconductor dark matter detectors to retain background discrimination at the low recoil energies produced by low-mass WIMPs. We find a calibrated baseline ionization resolution of σ E = 91 eV e e . To our knowledge, this is the best direct ionization resolution achieved with such massive ( ≈ 150 pF… Expand
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