A Failure-Detection Strategy for IGBT Based on Gate-Voltage Behavior Applied to a Motor Drive System

@article{RodrguezBlanco2011AFS,
  title={A Failure-Detection Strategy for IGBT Based on Gate-Voltage Behavior Applied to a Motor Drive System},
  author={Marco Antonio Rodr{\'i}guez-Blanco and Abraham Claudio-Sanchez and Didier Theilliol and Luis Gerardo Vela-Vald{\'e}s and Pedro Sibaja-Ter{\'a}n and Leobardo Hern{\'a}ndez-Gonz{\'a}lez and Jesus Aguayo-Alquicira},
  journal={IEEE Transactions on Industrial Electronics},
  year={2011},
  volume={58},
  pages={1625-1633}
}
In this paper, a novel failure-detection technique and its analog circuit for insulated gate bipolar transistors (IGBTs), under open- and short-circuit failures, are proposed. This technique is applied to a three-phase induction-motor (IM) drive system. The detection technique is adapted to detect failures of short-circuit and open-circuit in the IGBT, which is based on gate-signal monitoring. The most important issue of this technique is the reduction of time for fault detection. This is very… CONTINUE READING
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