A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3-D-Stacked ICs

@article{Agrawal2016ADR,
  title={A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3-D-Stacked ICs},
  author={Mukesh Agrawal and Krishnendu Chakrabarty and Bill Eklow},
  journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
  year={2016},
  volume={35},
  pages={309-322}
}
We present an end-to-end design of a built-in self-test (BIST) and BIST-based diagnosis infrastructure for 3-D-stacked integrated circuits (ICs) that facilitates the use of BIST at multiple stages of 3-D integration. The proposed BIST design is distributed, reusable, and reconfigurable, hence it is attractive for both prebond and post-bond testing. We also provide support for translating a static BIST schedule into a set of BIST control instructions. The BIST design is validated using detailed… CONTINUE READING

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