A Design of Programmable Logic Arrays with Universal Tests

@article{Fujiwara1981ADO,
  title={A Design of Programmable Logic Arrays with Universal Tests},
  author={Hideo Fujiwara and Kozo Kinoshita},
  journal={IEEE Transactions on Computers},
  year={1981},
  volume={C-30},
  pages={823-828}
}
In this paper the problem of fault detection in easily testable programmable logic arrays (PLA's) is discussed. The easily testable PLA's will be designed by adding extra logic. These augmented PLA's have the following features: 1) for a PLA with n inputs and m columns (product terms), there exists a "universal" test set such that the test patterns and responses do not depend on the function of the PLA, but depend only on the size of the PLA (the values n and m); 2) the number of tests is of… CONTINUE READING

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