A Design-Specific and Thermally-Aware Methodology for Trading-Off Power and Performance in Leakage-Dominant CMOS Technologies


As CMOS technology scales deeper into the nanometer regime, factors such as leakage power and chip temperature emerge as critically important concerns for high-performance VLSI design. Consequently, enhancing processing performance is no longer the most important factor that dominates future circuit design considerations. This paper, for the first time… (More)
DOI: 10.1109/TVLSI.2008.2001060


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