A Delay Measurement Technique Using Signature Registers

Abstract

This paper proposes a delay measurement technique using signature registers, and a scan design for delay measurement utilizing the proposed delay measurement technique to detect small-delay defects. The delay of circuits can be measured with the scan design with lower area, smaller data volume, and shorter measurement time than with the conventional scan… (More)
DOI: 10.1109/ATS.2009.54

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