A Delay Generation Technique for Narrow Time Interval Measurement

  title={A Delay Generation Technique for Narrow Time Interval Measurement},
  author={Rashid Rashidzadeh and Roberto Muscedere and Majid Ahmadi and William C. Miller},
  journal={IEEE Transactions on Instrumentation and Measurement},
A new architecture for the on-chip measurement of short-time intervals is proposed in this paper. The measurement method is similar to a typical low-voltage measurement setup where the input signals are first amplified and then measured to relax the dynamic range of the succeeding analog-to-digital converter. In the proposed method, narrow time intervals are first amplified by a time amplifier (TAMP) and then measured by a time-to-digital converter. A delay-locked-loop (DLL) circuit is utilized… CONTINUE READING
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A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits

  • M. M. Hafed, N. Abaskharoun, G. W. Roberts
  • IEEE J. Solid-State Circuits, vol. 37, no. 4, pp…
  • 2002
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