A Comprehensive TDM Comparator Scheme for Effective Analysis of Oscillation-Based Test

@inproceedings{Roh2000ACT,
  title={A Comprehensive TDM Comparator Scheme for Effective Analysis of Oscillation-Based Test},
  author={Jeongjin Roh and Jacob A. Abraham},
  booktitle={VTS},
  year={2000}
}
We propose a comprehensive built-in self-test (BIST) methodology for analog and mixed-signal circuits. A timedivision multiplexing (TDM) comparator scheme was proposed as an effective signature analyzer for on-chip analog response compaction and pass/fail decision with minimum hardware overhead. By applying this scheme to the oscillation-based test, the oscillation frequency can be measured indirectly as well as the oscillation amplitude to increase the fault coverage. The experimental results… CONTINUE READING
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