A Comparison of Very Fast to Very Slow Components in Degradation and Recovery Due to NBTI and Bulk Hole Trapping to Existing Physical Models

@article{Reisinger2007ACO,
  title={A Comparison of Very Fast to Very Slow Components in Degradation and Recovery Due to NBTI and Bulk Hole Trapping to Existing Physical Models},
  author={Hans Reisinger and Otto Blank and Wolfgang Heinrigs and Wolfgang Gustin and Christian Schlunder},
  journal={IEEE Transactions on Device and Materials Reliability},
  year={2007},
  volume={7},
  pages={119-129}
}
A new measuring technique with a 1mus measuring delay and a direct VT determination has been employed. The response to stress times as short as 100 mus to 105 has been studied as well as recovery over 12 decades in time. These experimental data allow a meaningful comparison to theory. Degradation data cut be precisely fitted to a simple physical model with 3 parameters thus enabling a reliable lifetime prediction from stress times below 104s. 
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Analytical reaction–diffusion model and the modeling of nitrogen-enhanced negative bias temperature instability

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