A Class of Test Generators for Built-In Testing


Currently proposed and used schemes for built-in testing (B-I-T) use as test generators either binary counters (exhaustive testing), linear feedback shift registers (semiexhaustive testing), or ROM's containing the test vectors (prestored testing). The disadvantages of these methods have been discussed in [41, and a store-and-generate B-I-T arrangement was proposed as a compromise between the exhaustive and the prestored form of test generation. Unfortunately, no systematic method was given for producing tests. In this note, we shall describe a test generator for a store-and-generate B-I-T arrangement based on the properties of anti-self-dual functions.

DOI: 10.1109/TC.1983.1676141

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@article{Aboulhamid1983ACO, title={A Class of Test Generators for Built-In Testing}, author={El Mostapha Aboulhamid and Eduard Cerny}, journal={IEEE Trans. Computers}, year={1983}, volume={32}, pages={957-959} }