A CONTINUOUS ELECTRON DENSITY APPROACH IN RIETVELD ANALYSIS FOR STRUCTURE INVESTIGATIONS OF THE MESOPOROUS SILICATE MATERIALS

@inproceedings{Solovyov2001ACE,
  title={A CONTINUOUS ELECTRON DENSITY APPROACH IN RIETVELD ANALYSIS FOR STRUCTURE INVESTIGATIONS OF THE MESOPOROUS SILICATE MATERIALS},
  author={Leonid A Solovyov and Sergey Dmitriev Kirik and Alexander N. Shmakov and Viatcheslav N Romannikov and Kristian Marx},
  year={2001}
}
A procedure of the structure factor simulation from a continuous electron density representation in combination with the full-profile structure refinement ( Rietveld technique) was developed and applied to structural characterization of pure siliceous mesoporous mesophase materials C16SiO2-MMM of the MCM-41 type. An analytical function was exploited to simulate the continuous electron density. The function arguments were used as r finable structure parameters. The technique allows both the… CONTINUE READING

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References

Publications referenced by this paper.
SHOWING 1-10 OF 10 REFERENCES

J

  • E. J. Sonneveld, J. W. Visser
  • Appl. Cryst., 8
  • 1975
Highly Influential
4 Excerpts

Derevyankin, S.V.Tsybulya, and G.N.Kryukova

  • V. N. Romannikov, V. B. Fenelonov, A. V. Nosov, A.Yu
  • Rus. Chem. Bull.,
  • 1999
1 Excerpt

Romannikov, and A.Yu. Derevyankin

  • V.N.V.B. Fenelonov
  • Microporous and Mesoporous Materials,
  • 1999
1 Excerpt

J

  • K. J. Edler, F. A. Reynolds, J. W. White, D. Cookson
  • Chem. Soc., Faraday Trans., 93(1)
  • 1997

Chem

  • S. Inagaki, Y. Sakamoto, Y. Fukushima, O. Terasaki
  • Mater., 8
  • 1996
2 Excerpts

Powder Diffraction

  • L. A. Solovyov, M. L. Blokhina, S. D. Kirik, A. I. Blokhin, M. G. Derikova
  • 11
  • 1996
1 Excerpt

J

  • B. P. Feuston, J. B. Higgins
  • Phys. Chem., 98
  • 1994

Mol

  • G. D. Stucky, A. Monnier, +8 authors B. F. Chmelka
  • Cryst. Liq. Cryst., 240
  • 1994
1 Excerpt

H

  • A. Le Bail
  • Duroy, and J.L. Fourquet , Mater. Res. Bull…
  • 1988

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