A CMOS IR-UWB Transceiver Design for Contact-Less Chip Testing Applications

  title={A CMOS IR-UWB Transceiver Design for Contact-Less Chip Testing Applications},
  author={Yanjie Wang and Ali M. Niknejad and Vincent C. Gaudet and Krzysztof Iniewski},
  journal={IEEE Transactions on Circuits and Systems II: Express Briefs},
This paper presents a novel CMOS impulse radio (IR) ultra-wide-band (UWB) transceiver system design for future contact-less chip testing applications using inductive magnetic coupling as wireless interconnect. The proposed architecture is composed of a simple and robust design of a Gaussian monocycle impulse generator at the transmitter, a wideband short-range on-chip transformer for data transmission, and a gm-boosted common-gate low-noise amplifier in the UWB receiver path. SpectreRF post… CONTINUE READING
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